Skip to main content

New nanoscale system for materials and devices characterization

"Nanoscale Technology"

 

The objective of this project is to develop a state-of-the-art scanning probe microscope (SPM) based instrumentation, integrated with bias modulated hardware, to probe local charge carrier dynamics in nanostructured and disordered materials with high spatial and temporal resolution. The new system will be the first of its kind, which can probe charge carrier dynamics and map carrier density, transport/recombination lifetimes, diffusion length, mobility and recombination rates with high spatial (nm) and temporal (sub-μs) resolution in a wide variety of electronic materials and devices. Currently two PhD students and one MS students are working on this project. This work is funded by NSF.

Contact: Dr. Qiquan Qiao